Spring, the universal test test needle, and large current charging needle, BGA high frequency (semiconductor) double needle, etc. ...
Can improve the efficiency of the test department immediately and reduce the production cost
Solve the pseudo open (false) appeared in the process of test, the resistance is not stable, the life is short, poor contact, prod...
Is electrical testing contact medium for high precise electronic hardware components. Probe is a short period of single-stranded D...
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